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Search for "piezoelectric cantilever, self-sensing" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement

  • Steven Ian Moore,
  • Michael G. Ruppert and
  • Yuen Kuan Yong

Beilstein J. Nanotechnol. 2017, 8, 358–371, doi:10.3762/bjnano.8.38

Graphical Abstract
  • multifrequency AFM and has the potential to provide higher resolution imaging on higher order modes. Keywords: atomic force microscopy; multifrequency AFM; multimodal AFM; piezoelectric cantilever, self-sensing; Introduction The invention of the atomic force microscope (AFM) [1] provided for the observation of
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Published 06 Feb 2017

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

  • Michael G. Ruppert and
  • S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

Graphical Abstract
  • fundamental mode, and phase imaging on the higher eigenmode. Keywords: atomic force microscopy; charge sensing; feedthrough cancellation; multimode sensor; piezoelectric cantilever; self-sensing; Introduction Emerging methods in multifrequency atomic force microscopy (MF-AFM) rely on the detection and
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Published 24 Feb 2016
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